• DocumentCode
    3264020
  • Title

    Approach to solve synthetic test circuit for testing of high voltage circuit breaker

  • Author

    Gaur, Vishal Kumar ; Jariwala, H.R.

  • Author_Institution
    Electr. Eng. Dept., Pandit Deendayal Pet. Univ., Gandhinagar, India
  • fYear
    2015
  • fDate
    10-13 June 2015
  • Firstpage
    1187
  • Lastpage
    1192
  • Abstract
    Development in electrical power transmission system and higher voltage level operation of power systems require circuit breakers of higher interrupting capability. To ensure interrupting capability, circuit breakers must verify and prove the TRV withstand capability specified according to standards. To test high voltage circuit breakers, direct testing using power system network or short-circuit alternators are not feasible and practical solution. But synthetic testing is an alternative equivalent economical method for testing of high voltage circuit breakers. In synthetic test circuit, it is quite complex to choose circuit components value for a desired TRV envelope. This paper purposes a synthesis process to design synthetic test circuit to generate four-parameter TRV envelope for circuit breaker testing. By using proposed approach a synthetic test circuit has been designed and simulated in MATLAB to generate four-parameter TRV envelope for 145 kV, 40 kA rating circuit breaker.
  • Keywords
    alternators; circuit breakers; power transmission; short-circuit currents; MATLAB; TRV envelope; alternative equivalent economical method; current 40 kA; electrical power transmission system; high voltage circuit breaker; interrupting capability; power system network; short-circuit alternators; synthetic test circuit; voltage 145 kV; Capacitors; Circuit breakers; Interrupters; Testing; Transfer functions; Transient analysis; Four-parameter TRV envelope; Synthetic testing; TRV rating concept;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Environment and Electrical Engineering (EEEIC), 2015 IEEE 15th International Conference on
  • Conference_Location
    Rome
  • Print_ISBN
    978-1-4799-7992-9
  • Type

    conf

  • DOI
    10.1109/EEEIC.2015.7165337
  • Filename
    7165337