Title :
Analysis of degradation mechanisms in high power AlGaAs 808 nm laser bars
Author :
Arias, J. ; Esquivias, I. ; Daiminge, F.X. ; Heineman, S. ; Vassilakis, E. ; Hirtz, J.P.
Author_Institution :
Dept. Tecnologia Fotonica, Univ. Politecnica de Madrid, Spain
Abstract :
In this work we study the degradation mechanisms of 20 W CW AlGaAs linear array bars by analyzing the subthreshold Optical Power-Current-Voltage characteristics (P-I-V) at different aging times. The laser structure is a single quantum well graded index separate confinement heterostructure (SQW-GRINSCH) grown by metal organic chemical vapor deposition. Monolithic 1 cm linear array bars with multiple emitters were mounted p-side down onto high thermal conductivity submounts. Seven different laser bars coming from the same wafer were aged at a constant current of 30 A. The main optoelectronic characteristics (threshold current, slope efficiency, conversion efficiency, lasing wavelength) and the subthreshold P-I-V characteristics were measured as a function of the aging time. The spontaneous optical power emitted from the low-reflectivity facet and the external voltage were accurately measured at drive currents ranging between 1 nA and 1 A
Keywords :
III-V semiconductors; ageing; aluminium compounds; gallium arsenide; laser reliability; quantum well lasers; semiconductor laser arrays; 20 W; 808 nm; AlGaAs; MOCVD; SQW-GRINSCH laser; aging; conversion efficiency; degradation; high power CW laser; lasing wavelength; monolithic linear array bar; reliability; slope efficiency; subthreshold optical power-current-voltage characteristics; threshold current; Aging; Bars; Chemical lasers; Current measurement; Degradation; Optical arrays; Quantum well lasers; Stimulated emission; Thermal conductivity; Wavelength measurement;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1997. LEOS '97 10th Annual Meeting. Conference Proceedings., IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-3895-2
DOI :
10.1109/LEOS.1997.645256