Title :
Techniques for the diagnosis of switching circuit failures
Author :
Galey, J.M. ; Norby, R.E. ; Roth, J.P.
Abstract :
In 2.12 minutes an IBM 7090 program found four input tests (for an 8-input parity check circuit) whose outcome determines whether any one of 102 possible failures occurred. For any single-output combinational circuit, with no more than 35 input variables, the program computes the set of all inputs detecting a given failure - the essential novelty of the method. These sets, one for each failure, are then Processed to find a (small) subset of tests which detect any failure. The underlying method extends to the diagnosis of circuits with feedback.
Keywords :
Switching circuits;
Conference_Titel :
Switching Circuit Theory and Logical Design, 1961. SWCT 1961. Proceedings of the Second Annual Symposium on
Conference_Location :
Detroit, MI, USA
DOI :
10.1109/FOCS.1961.33