DocumentCode :
3264535
Title :
Techniques for the diagnosis of switching circuit failures
Author :
Galey, J.M. ; Norby, R.E. ; Roth, J.P.
fYear :
1961
fDate :
17-20 Oct. 1961
Firstpage :
152
Lastpage :
160
Abstract :
In 2.12 minutes an IBM 7090 program found four input tests (for an 8-input parity check circuit) whose outcome determines whether any one of 102 possible failures occurred. For any single-output combinational circuit, with no more than 35 input variables, the program computes the set of all inputs detecting a given failure - the essential novelty of the method. These sets, one for each failure, are then Processed to find a (small) subset of tests which detect any failure. The underlying method extends to the diagnosis of circuits with feedback.
Keywords :
Switching circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Switching Circuit Theory and Logical Design, 1961. SWCT 1961. Proceedings of the Second Annual Symposium on
Conference_Location :
Detroit, MI, USA
Type :
conf
DOI :
10.1109/FOCS.1961.33
Filename :
5397286
Link To Document :
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