• DocumentCode
    3264535
  • Title

    Techniques for the diagnosis of switching circuit failures

  • Author

    Galey, J.M. ; Norby, R.E. ; Roth, J.P.

  • fYear
    1961
  • fDate
    17-20 Oct. 1961
  • Firstpage
    152
  • Lastpage
    160
  • Abstract
    In 2.12 minutes an IBM 7090 program found four input tests (for an 8-input parity check circuit) whose outcome determines whether any one of 102 possible failures occurred. For any single-output combinational circuit, with no more than 35 input variables, the program computes the set of all inputs detecting a given failure - the essential novelty of the method. These sets, one for each failure, are then Processed to find a (small) subset of tests which detect any failure. The underlying method extends to the diagnosis of circuits with feedback.
  • Keywords
    Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Switching Circuit Theory and Logical Design, 1961. SWCT 1961. Proceedings of the Second Annual Symposium on
  • Conference_Location
    Detroit, MI, USA
  • Type

    conf

  • DOI
    10.1109/FOCS.1961.33
  • Filename
    5397286