Title :
1999 IEEE AUTOTESTCON Proceedings (Cat. No.99CH36323)
fDate :
Aug. 30 1999-Sept. 2 1999
Abstract :
The following topics were dealt with: model based systems; distributed systems; information infrastructure advances; VXI-based test stations; knowledge based systems; military and non-military testing; test systems design; commercial applications; ATE migration; advanced test methods; ATS standardization; COTS ATE; management issues; TPS issues; weapons testing; advanced diagnostics; test generation techniques
Keywords :
automatic test equipment; automatic test software; automatic testing; ATE migration; ATS standardization; COTS ATE; TPS issues; VXI-based test stations; advanced diagnostics; advanced test methods; commercial applications; distributed systems; information infrastructure advances; knowledge based systems; management issues; military testing; model based systems; test generation techniques; test systems design; weapons testing;
Conference_Titel :
AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
Conference_Location :
San Antonio, TX, USA
Print_ISBN :
0-7803-5432-X
DOI :
10.1109/AUTEST.1999.800349
