Title :
Functional considerations for development of SDH technology-based broadband digital cross-connect system
Author :
Kim, Si-Won ; Park, Ki-Shick
Author_Institution :
Electron. & Telecommun. Res. Inst., Daejeon, South Korea
fDate :
30 Jun-2 Jul 1998
Abstract :
It is necessary to enhance the telecommunication environments to support high speed and flexible networking. To meet this purpose, the paper describes the functional considerations for the development of a digital cross-connect system, named the BDCS (broadband DCS), that is based on the SDH (synchronous digital hierarchy) technology. These are the switching functions, network survivability functions, sub-network management functions and the test access functions. In examining the switching functions for the cross-connection of the individual AU (administrative unit) and TU (tributary unit), the paper describes the switching steps and discusses the system capacity. The network survivability functions are described with reference to their importance in the public network. A method for the total network management function with sub-network management capabilities is suggested. The test access functions are described in view of its capacity and test methods
Keywords :
broadband networks; digital communication; synchronous digital hierarchy; telecommunication equipment testing; telecommunication network management; telecommunication network reliability; BDCS; SDH technology; add/drop multiplexers; administrative unit; broadband DCS; broadband digital cross-connect system; network survivability; optical signals; public network; sub-network management; switching functions; synchronous digital hierarchy; system capacity; test access functions; test methods; total network management function; tributary unit; Add-drop multiplexers; Bandwidth; Gold; Personnel; Spine; Synchronous digital hierarchy; Telecommunication network topology; Telecommunication switching; Telecommunication traffic; Testing;
Conference_Titel :
Computers and Communications, 1998. ISCC '98. Proceedings. Third IEEE Symposium on
Conference_Location :
Athens
Print_ISBN :
0-8186-8538-7
DOI :
10.1109/ISCC.1998.702575