Testing and reliability

fYear

2011

fDate

16-18 June 2011

Firstpage

477

Lastpage

478

Abstract

Start of the above-titled section of the conference proceedings record.

fLanguage

English

Publisher

ieee

Conference_Titel

Mixed Design of Integrated Circuits and Systems (MIXDES), 2011 Proceedings of the 18th International Conference

Conference_Location

Gliwice

Print_ISBN

978-1-4577-0304-1

Type

conf

Filename

6016062

Link To Document