Title :
Concurrent engineering for automatic test station development
Author :
Lisonbee, James C. ; Chisolm, Kenneth C. ; Sithivong, Mano
Author_Institution :
Air Logistics Center, Hill AFB, UT, USA
Abstract :
During the planning stage for development of a new test station or upgrade, one becomes very aware that there are many tasks to accomplish in a short period of time. It is often important to maintain a short development cycle while accomplishing both hardware and software tasks such as hardware selection and driver development. Concurrent engineering allows for a simultaneous activity of hardware and software personnel during test station development. This paper will discuss the application of concurrent engineering during development of the F-16 Analog Test Station Sustainment (FATSS) project and how these principles can easily be applied to other development efforts
Keywords :
automatic test equipment; automatic test software; concurrent engineering; device drivers; peripheral interfaces; software tools; virtual instrumentation; F-16 Analog Test Station Sustainment; FATSS project; VXI equipment; automatic test station development; concurrent engineering; driver development; hardware selection; repair capability; short development cycle; software driver; software tools selection; Automatic testing; Concurrent engineering; Hardware; Instruments; Life testing; Logistics; Personnel; Software engineering; Software tools; Voltage;
Conference_Titel :
AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-5432-X
DOI :
10.1109/AUTEST.1999.800366