DocumentCode
3265356
Title
Instrument driver design
Author
Vuu, Lan ; Khan, Amin
Author_Institution
Air Logistics Center, Hill AFB, UT, USA
fYear
1999
fDate
1999
Firstpage
129
Lastpage
131
Abstract
Many organizations in Automatic Test Equipment (ATE) are involved in upgrading aging test stations or development of new test stations to state-of-the-art VXI plug&play technology. The instrument drivers for the F-16 Analog Test Station Sustainment (FATSS) were developed using the LABWindows/CVI environment with Object-Oriented (OO) programming design. The objective of this paper is to illustrate the driver development using this OO architecture
Keywords
automatic test equipment; automatic test software; device drivers; object-oriented programming; peripheral interfaces; virtual instrumentation; ATE; F-16 Analog Test Station Sustainment; LABWindows/CVI environment; OO programming design; VXI plug&play technology; development environment tools; hardware layers; instrument drivers; legacy systems; public functions layers; upgrading aging test stations; vendor layers; Aging; Automatic test equipment; Hardware; Instruments; Logistics; Manufacturing; Object oriented programming; Software engineering; Software libraries; Software testing;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
Conference_Location
San Antonio, TX
ISSN
1080-7725
Print_ISBN
0-7803-5432-X
Type
conf
DOI
10.1109/AUTEST.1999.800368
Filename
800368
Link To Document