DocumentCode :
3265525
Title :
Satellite hierarchical system test using IEEE 1149.1-based COTS test tools. A case history with results and lessons
Author :
Lee, Larry ; Andrews, John
Author_Institution :
Hughes Space Commun., El Segundo, CA, USA
fYear :
1999
fDate :
1999
Firstpage :
193
Lastpage :
201
Abstract :
Hughes Space Communications applied IEEE Standard 1149.1-1990, The Standard Test Access Port and Boundary-Scan Architecture, to design a structured testing methodology for its HS601 digital global communication satellites. Previous functional test strategies were being challenged by increasing component density and rapidly increasing manufacturing volume. Structural tests written for ASICs were reusable when testing MCMs, boards, and units. Structural testing resulted in fewer no-fault-found components than previously experienced using functional test strategies. System test access across backplanes was achieved using National Semiconductor´s multidrop, addressable 1149.1-based SCAN Bridge. Commercially available enhancements to Teradyne´s Victory software were used to address each 1149.7-testable component at each level of the hardware hierarchy. Hughes Space Communications created test management software to manage this test environment. Whenever a test is needed, if is assembled to match the hardware version and the appropriate level of hierarchy. This paper presents the results for a global communications satellite system that uses a test strategy outlined
Keywords :
IEEE standards; application specific integrated circuits; artificial satellites; automatic test software; design for testability; hierarchical systems; integrated circuit testing; multichip modules; printed circuit testing; production testing; satellite communication; telecommunication equipment testing; telecommunication standards; ASIC; COTS test tools; HS601 digital global communication satellites; Hughes Space Communications; IEEE 1149.1; MCM; National Semiconductor; PC boards; Teradyne´s Victory software; functional test strategies; manufacturing volume; satellite hierarchical system test; test management software; Artificial satellites; Communication standards; Environmental management; Global communication; Hardware; Hierarchical systems; Semiconductor device manufacture; Semiconductor device testing; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
Conference_Location :
San Antonio, TX
ISSN :
1080-7725
Print_ISBN :
0-7803-5432-X
Type :
conf
DOI :
10.1109/AUTEST.1999.800377
Filename :
800377
Link To Document :
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