Automated testing of high speed high resolution, A to D converters

Author

Kings, Charles ; Mumford, Susan

Author_Institution

Northrop Grumman Corp., Linthicum, MD, USA

fYear

1999

fDate

1999

Firstpage

235

Lastpage

242

Abstract

This paper describes an automated test set designed and built to test a 14 bit, 5.2 MHz A/D using a sinusoidal input. The familiar transfer function plots for integral nonlinearity are obtained by using a sine wave-to-linear transformation instead of the traditional stepped ramp input. Each of the software functions that process the input sine wave data to produce the analytical output data will be detailed, and the test results will be presented in graphical form. The INL, DNL and frequency domain plots will be interpreted for 14 bit A/Ds running at multiple sampling frequencies

Keywords

analogue-digital conversion; automatic test equipment; circuit testing; 5.2 MHz; A/D converters; DNL; INL; automated test set; automated testing; frequency domain; linearity; multiple sampling frequencies; sine wave-to-linear transformation; sinusoidal input; software functions; time domain; transfer function; Automatic testing; Frequency domain analysis; Hardware; Linearity; Power harmonic filters; Sampling methods; Signal resolution; Signal to noise ratio; Total harmonic distortion; Transfer functions;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE

Conference_Location

San Antonio, TX

ISSN

1080-7725

Print_ISBN

0-7803-5432-X

Type

conf

DOI

10.1109/AUTEST.1999.800385

Filename

800385