DocumentCode :
3265804
Title :
Reconfigurable COTS test systems
Author :
Gutterman, Loofie A.
Author_Institution :
Geotest-Marvin Test Syst. Inc., Santa Ana, CA, USA
fYear :
1999
fDate :
1999
Firstpage :
301
Lastpage :
303
Abstract :
Automatic Test Equipment (ATE) systems are used to qualify, accept, and troubleshoot electronic products. ATE systems may be in the form of large general-purpose systems that can test a wide variety of products or the more commonly used custom, turnkey systems that are designed for specific test application(s) and requirements. Turnkey ATE systems are labor-intensive. As a result, even a relatively simple turnkey tester is costly and may take months (or even years) to develop, integrate, and deploy. The main reason for this aspect of turnkey ATE systems is that even though the instrumentation may be off-the-shelf components, most everything else is custom and requires design, development, extensive debug and integration. Time and again, systems integrators have tried to find a solution that would combine the cost effectiveness of Commercial-off-the-shelf (COTS) systems with the flexibility of custom ATE. This paper suggests that there is a solution to this problem and that it is feasible to combine COTS testers with custom requirements. This solution, called CreATE, provides a flexible architecture using COTS components (including instruments, cabling and interfacing products)
Keywords :
automatic test equipment; automatic test software; software portability; software tools; ATE systems; CreATE architecture; TPS development; cost effectiveness; custom ATE; custom turnkey systems; flexible architecture; large general-purpose systems; off-the-shelf interfacing; reconfigurable COTS test systems; reusable components; Automatic testing; Circuit testing; Costs; Electronic equipment testing; Hardware; Instruments; Packaging; Power distribution; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
Conference_Location :
San Antonio, TX
ISSN :
1080-7725
Print_ISBN :
0-7803-5432-X
Type :
conf
DOI :
10.1109/AUTEST.1999.800394
Filename :
800394
Link To Document :
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