Title :
Reusable test executive and test programs methodology and implementation comparison between HP VEE and LabView
Author_Institution :
Syst. Eng., Tiltan, Benei-Beraq, Israel
Abstract :
The paper outlines the requirements for a reusable test executive and reusable test programs. The concepts of generic test programs and test program sets are introduced then the process of creating test program sets (TPS) from generic test programs, using a TPS editor is described. Various aspects of implementation are compared between HP VEE and NI LabView
Keywords :
automatic test software; device drivers; software reusability; HP VEE; NI LabView; TPS editor; composite data types; execution engine; generic test program sets; generic test programs; implementation comparison; instrument drivers; operator interface; reusable test executive; reusable test programs; user management; Control systems; Electronic equipment testing; Engines; Software testing; System testing; Systems engineering and theory; Tellurium; Temperature; Time to market; Voltage;
Conference_Titel :
AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-5432-X
DOI :
10.1109/AUTEST.1999.800395
