DocumentCode
3265959
Title
A hidden Markov model based algorithm for online fault diagnosis with partial and imperfect tests
Author
Ying, Jie ; Kirubarajan, T. ; Pattipati, Krishna R. ; Deb, Somnath
Author_Institution
Dept. of Electr. & Syst. Eng., Connecticut Univ., Storrs, CT, USA
fYear
1999
fDate
1999
Firstpage
355
Lastpage
366
Abstract
In this paper, we present a Hidden Markov Model (HMM) based algorithm for online fault diagnosis in complex large-scale systems with partial and imperfect tests. The HMM-based algorithm handles test uncertainties and inaccuracies, finds the best estimate of system states and identifies the dynamic changes in system states, such as from a fault-free state to a faulty one. We also present two methods to estimate the model parameters, namely, the state transition probabilities and the instantaneous probabilities of observed test outcomes, for adaptive fault diagnosis. In order to validate the adaptive parameter estimation techniques, we present simulation results with and without the knowledge of HMM parameters. In addition, the advantages of using the HMM approach over a Hamming-distance based fault diagnosis technique are quantified. Tradeoffs in complexity versus performance of the diagnostic algorithm are discussed
Keywords
adaptive estimation; failure analysis; fault diagnosis; hidden Markov models; large-scale systems; parameter estimation; reliability theory; signal flow graphs; state estimation; Viterbi algorithm; adaptive fault diagnosis; adaptive parameter estimation techniques; complex large-scale systems; complexity versus performance tradeoffs; digraph model; dynamic changes; fault-free state; faulty state; hidden Markov model based algorithm; imperfect tests; instantaneous probabilities; linear difference equation; model parameters; observed test outcomes; online fault diagnosis; partial tests; sliding window technique; state transition probabilities; system states; test inaccuracies; test uncertainties; Fault diagnosis; Hidden Markov models; Intelligent sensors; Monitoring; Parameter estimation; Sensor systems; Signal processing algorithms; State estimation; System testing; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
Conference_Location
San Antonio, TX
ISSN
1080-7725
Print_ISBN
0-7803-5432-X
Type
conf
DOI
10.1109/AUTEST.1999.800402
Filename
800402
Link To Document