• DocumentCode
    3265975
  • Title

    A study of IGBT turn-off behavior and switching losses for zero-voltage and zero-current switching

  • Author

    Chen, Keming ; Stuart, Thomas A.

  • Author_Institution
    REM Technologies, Schenectady, NY, USA
  • fYear
    1992
  • fDate
    23-27 Feb 1992
  • Firstpage
    411
  • Lastpage
    418
  • Abstract
    The switching losses of insulated gate bipolar transistors (IGBTs) with zero voltage and zero current switching are compared with the switching losses of IGBTs with hard switching. The turn-off behavior of the IGBT is studied in detail for both zero voltage and zero current switching. The effect of a reverse current during turn-off is also investigated for zero current switching
  • Keywords
    insulated gate bipolar transistors; losses; power transistors; semiconductor device testing; switching circuits; IGBT turn-off behavior; ZCS; ZVS; power transistors; reverse current; semiconductor device testing; switching losses; zero current switching; zero voltage switching; Diodes; Insulated gate bipolar transistors; MOSFETs; Pulse width modulation converters; Switching circuits; Switching converters; Switching loss; Tail; Zero current switching; Zero voltage switching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition, 1992. APEC '92. Conference Proceedings 1992., Seventh Annual
  • Conference_Location
    Boston, MA
  • Print_ISBN
    0-7803-0485-3
  • Type

    conf

  • DOI
    10.1109/APEC.1992.228381
  • Filename
    228381