DocumentCode :
3266067
Title :
Cost and benefit considerations for implementing an open systems approach to integrated diagnostics
Author :
Freschi, Steven
Author_Institution :
AverStar Inc., Vienna, VA, USA
fYear :
1999
fDate :
1999
Firstpage :
391
Lastpage :
404
Abstract :
The Department of Defense recently completed a study that recommended an information-based approach to implementing an open architecture for integrating diagnostic functions as a critical and enabling step towards achieving the Department´s strategic goals of reducing total ownership cost, shortening cycle time for technology insertion and increasing interoperability of fielded systems. There are, however, a number of challenges to successfully implementing an integrated diagnostic process on a weapon systems program to realize these benefits. The underlying source of these challenges is often the less than formal way for test and diagnostics engineers to participate in the systems engineering process and thereby compete for investment resources. To effectively participate in the trade-off studies associated with this process, a clear association must be made between the investment required for a particular integrated diagnostic functionality and the benefits that would be derived. This paper will explore a generic framework for addressing such cost and benefit considerations. To accomplish this, an open, information-based architecture for integrated diagnostics will be defined along with how it would be applied throughout a product life-cycle and the linkage of these capabilities with generic life cycle cost elements. Commercial and government systems will be used to validate these assertions
Keywords :
automatic test equipment; automatic test software; avionics; cost-benefit analysis; life cycle costing; military avionics; open systems; systems engineering; ATS; avionics; commercial systems; cost and benefit considerations; fielded systems; generic framework; generic life cycle cost elements; government systems; information-based architecture; integrated diagnostics; interoperability; open systems approach; product life-cycle; shortened cycle time; supportability; technology insertion; total ownership cost reduction; trade-off studies; weapon systems program; Computer architecture; Cost function; Government; Hardware; Investments; Open systems; Springs; System testing; Systems engineering and theory; Weapons;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
Conference_Location :
San Antonio, TX
ISSN :
1080-7725
Print_ISBN :
0-7803-5432-X
Type :
conf
DOI :
10.1109/AUTEST.1999.800407
Filename :
800407
Link To Document :
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