Title :
Calculation of test time required to remove infant mortality failures [product quality control]
Author_Institution :
Stratus Computer, Marlboro, MA, USA
Abstract :
The author presents two methods of calculating the manufacturing test time required to achieve a specific product failure rate using reliability growth models. An example of the Duane model illustrates the method using the approximate times to failure. The AMSAA model calculates the test times using exact time to failure. The results of these models are used to calculate the percentage of product failing due to `infant mortality´ reasons
Keywords :
failure analysis; quality control; reliability; testing; AMSAA model; Duane model; QC; infant mortality failures; manufacturing test time; product failure rate; product quality control; reliability growth models; Circuit synthesis; Circuit testing; Condition monitoring; Equations; Manufacturing processes; Pulp manufacturing; Quality control; Virtual manufacturing;
Conference_Titel :
Applied Power Electronics Conference and Exposition, 1992. APEC '92. Conference Proceedings 1992., Seventh Annual
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-0485-3
DOI :
10.1109/APEC.1992.228393
