DocumentCode
3266180
Title
Calculation of test time required to remove infant mortality failures [product quality control]
Author
Kane, Vin
Author_Institution
Stratus Computer, Marlboro, MA, USA
fYear
1992
fDate
23-27 Feb 1992
Firstpage
325
Lastpage
329
Abstract
The author presents two methods of calculating the manufacturing test time required to achieve a specific product failure rate using reliability growth models. An example of the Duane model illustrates the method using the approximate times to failure. The AMSAA model calculates the test times using exact time to failure. The results of these models are used to calculate the percentage of product failing due to `infant mortality´ reasons
Keywords
failure analysis; quality control; reliability; testing; AMSAA model; Duane model; QC; infant mortality failures; manufacturing test time; product failure rate; product quality control; reliability growth models; Circuit synthesis; Circuit testing; Condition monitoring; Equations; Manufacturing processes; Pulp manufacturing; Quality control; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition, 1992. APEC '92. Conference Proceedings 1992., Seventh Annual
Conference_Location
Boston, MA
Print_ISBN
0-7803-0485-3
Type
conf
DOI
10.1109/APEC.1992.228393
Filename
228393
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