Title :
Testing for Year 2000 readiness-technical and management issues
Author :
Downing, Walter D. ; Hokanson, Jim
Author_Institution :
Southwest Res. Inst., San Antonio, TX, USA
Abstract :
The approach of the Year 2000 (Y2K) has called into question the condition of readiness of computer systems upon which organizations depend. Will these systems operate reliably after midnight, January 1, 2000, or will problems associated with date calculations cause failures that adversely affect users? This question has caused organizations to identify their critical systems, test these systems for Y2K problems, and take corrective action where necessary to ensure Y2K readiness. This paper will examine various technical and management issues that Southwest Research Institute has dealt with in solving these problems
Keywords :
program testing; software maintenance; software management; Year 2000 compliance; Year 2000 readiness testing; critical systems identification; date-sensitive functions; leap-year calculations; management issues; special meanings for dates; technical issues; two-digit date storage; Application software; Control systems; Embedded computing; Embedded software; Hardware; Operating systems; Personal communication networks; Software performance; Software systems; System testing;
Conference_Titel :
AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-5432-X
DOI :
10.1109/AUTEST.1999.800418