• DocumentCode
    3266457
  • Title

    An Intelligent Diagnostic/Prognostic Framework for Automotive Electrical Systems

  • Author

    Abbas, Manzar ; Ferri, Aldo A. ; Orchard, Marcos E. ; Vachtsevanos, George J.

  • Author_Institution
    Georgia Inst. of Technol., Atlanta
  • fYear
    2007
  • fDate
    13-15 June 2007
  • Firstpage
    352
  • Lastpage
    357
  • Abstract
    Automotive systems are becoming increasingly dependent on electrical components, computer control, and sensors. It has become extremely critical to detect faults in the electrical system and predict the remaining useful life of failing components. This paper introduces an integrated methodology for monitoring, modeling, data processing, fault diagnosis, and failure prognosis of critical electrical components such as the battery. The enabling technologies include signal processing, sensor selection and placement, selection and extraction of optimum condition indicators, and accurate fault diagnosis and failure prognosis algorithms that are based on both the physics of failure models and Bayesian estimation methods. The proposed architecture is implementable on-board an Electronic Control Unit (ECU) requiring minimum computational resources. Potential benefits include reduction in maintenance costs, improved asset reliability and availability and longer life of critical components.
  • Keywords
    Bayes methods; automotive electronics; fault diagnosis; traffic engineering computing; Bayesian estimation methods; automotive electrical systems; automotive systems; computer control; electrical components; electronic control unit; failure prognosis; fault diagnosis; sensor placement; sensor selection; signal processing; Automotive engineering; Computerized monitoring; Condition monitoring; Control systems; Electrical fault detection; Fault diagnosis; Intelligent sensors; Intelligent vehicles; Sensor systems; Signal processing algorithms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Vehicles Symposium, 2007 IEEE
  • Conference_Location
    Istanbul
  • ISSN
    1931-0587
  • Print_ISBN
    1-4244-1067-3
  • Electronic_ISBN
    1931-0587
  • Type

    conf

  • DOI
    10.1109/IVS.2007.4290139
  • Filename
    4290139