DocumentCode :
3266489
Title :
Weapon interface simulation
Author :
Van Cleve, David P.
Author_Institution :
Test Syst. Design Center, Raytheon Syst. Co., Tucson, AZ, USA
fYear :
1999
fDate :
1999
Firstpage :
593
Lastpage :
597
Abstract :
Weapon interface simulation is a viable test approach that increases aircraft and crew war readiness. Guided missile Built-in-Test (BIT) checks use test equipment that performs the same BIT cycle initiated during tactical use by the launch aircraft. Although this is a commonly accepted test approach for monitions within the MIL-STD-1760 family, the various aircraft that support the MIL-STD-1760 interface are not tested in the same manner. Day-to-day verification of the aircraft weapons capability relies on BIT checks of the individual avionics units. These BIT checks verify the overall functionality of each Line Replaceable Unit (LRU) but do not provide an integrated test of specific weapon interface functions. Consequently BIT checks are supplemented with periodic functional testing performed directly at the aircraft to missile interface and consist of static checks of power forms and discrete signals, as well as limited transfers of information over the serial data interface. Aircraft testing in this manner inadequately exercises integrated avionics functions that support missile initialization, target queuing, and missile release. The result is reduced aircraft weapons readiness and reliability. Testing of the aircraft weapon interface by dynamically simulating the missile interface and exercising the aircraft from within tactical modes provides optimal test thoroughness and the best maximum achievable war readiness
Keywords :
aerospace simulation; aircraft computers; aircraft testing; automatic test equipment; built-in self test; fault simulation; military avionics; military computing; military standards; missile control; MIL-STD-1760 interface; aircraft testing; aircraft to missile interface; aircraft war readiness; crew war readiness; fault insertion; guided missile BIT checks; individual avionics units; integrated avionics functions; line replaceable unit; missile initialization; missile release; optimal test thoroughness; overall functionality; periodic functional testing; systems level test; target queuing; training applications; weapon interface simulation; Aerospace electronics; Aircraft navigation; Costs; Missiles; Performance evaluation; Power system reliability; Safety; System testing; Test equipment; Weapons;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
Conference_Location :
San Antonio, TX
ISSN :
1080-7725
Print_ISBN :
0-7803-5432-X
Type :
conf
DOI :
10.1109/AUTEST.1999.800433
Filename :
800433
Link To Document :
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