Title :
Multiple-input resonant-tunneling logic gates for flash A/D converter applications
Author :
Tsuji, Yuki ; Waho, Takao
Author_Institution :
Dept. of Electr. & Electron. Eng., Sophia Univ., Tokyo, Japan
Abstract :
Multiple-input resonant-tunneling (RT) logic gates have been proposed for flash analog-to-digital converter applications. An error-mode operation has been found in conventional RT gates called MOBILE, when the number of inputs increases. By introducing an RTD/HEMT series connection, to suppress the error operation, we can successfully design 4-, 8-, and 16-input RT gates, which are essential to obtain compact flash ADCs.
Keywords :
analogue-digital conversion; high electron mobility transistors; logic gates; resonant tunnelling diodes; threshold logic; 16 bit; 4 bit; 8 bit; MOBILE; RT gates; RTD/HEMT series connection; error-mode operation suppression; flash A/D converters; multiple-input logic gates; resonant-tunneling logic gates; threshold logic circuit; Analog-digital conversion; Circuit simulation; HEMTs; Logic circuits; Logic devices; Logic gates; MODFETs; Resonant tunneling devices; Signal processing;
Conference_Titel :
Multiple-Valued Logic, 2004. Proceedings. 34th International Symposium on
Print_ISBN :
0-7695-2130-4
DOI :
10.1109/ISMVL.2004.1319912
