DocumentCode :
3266525
Title :
The method of harmful bubbles detection using dynamic IR
Author :
Zhao, Fu ; Ge, Shuxin
Author_Institution :
Shijiazhuang Res. Inst. of Autom., China
fYear :
1996
fDate :
2-6 Dec 1996
Firstpage :
380
Lastpage :
384
Abstract :
A method of online detection using dynamic IR is presented here in order to detect whether there are any harmful bubbles inside the rectifier. This method is realized via analyzing the variation regulation of dynamic IR along time and temperature according to the physics characteristics of harmful bubbles. Its detection principle and detail method as well as the typical purpose are introduced in the article
Keywords :
bubbles; semiconductor device reliability; semiconductor device testing; solid-state rectifiers; harmful bubbles detection; online detection; rectifier; Automation; Corona; Glass; Infrared detectors; Rectifiers; Silicon; Temperature; Thermal resistance; X-ray detection; X-ray detectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Technology, 1996. (ICIT '96), Proceedings of The IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
0-7803-3104-4
Type :
conf
DOI :
10.1109/ICIT.1996.601613
Filename :
601613
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3266525
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