• DocumentCode
    3266525
  • Title

    The method of harmful bubbles detection using dynamic IR

  • Author

    Zhao, Fu ; Ge, Shuxin

  • Author_Institution
    Shijiazhuang Res. Inst. of Autom., China
  • fYear
    1996
  • fDate
    2-6 Dec 1996
  • Firstpage
    380
  • Lastpage
    384
  • Abstract
    A method of online detection using dynamic IR is presented here in order to detect whether there are any harmful bubbles inside the rectifier. This method is realized via analyzing the variation regulation of dynamic IR along time and temperature according to the physics characteristics of harmful bubbles. Its detection principle and detail method as well as the typical purpose are introduced in the article
  • Keywords
    bubbles; semiconductor device reliability; semiconductor device testing; solid-state rectifiers; harmful bubbles detection; online detection; rectifier; Automation; Corona; Glass; Infrared detectors; Rectifiers; Silicon; Temperature; Thermal resistance; X-ray detection; X-ray detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Technology, 1996. (ICIT '96), Proceedings of The IEEE International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7803-3104-4
  • Type

    conf

  • DOI
    10.1109/ICIT.1996.601613
  • Filename
    601613
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3266525