DocumentCode :
3266676
Title :
Characterization of ASD operation
Author :
Schwartzenberg, J.W. ; Stagliano, E.L. ; Kaplan, M.N. ; Chu, R.F.
Author_Institution :
Drexel Univ., Philadelphia, PA, USA
fYear :
1992
fDate :
23-27 Feb 1992
Firstpage :
139
Lastpage :
146
Abstract :
An attempt is made to characterize adjustable speed drive (ASD) operation and to identify probable causes for ASD tripping through extensive experiments. The documented results could be used: (1) to identify the impact of ADSs on the system, (2) to illuminate potential problem areas from an ASD application, and (3) to evaluate the performance of proposed solutions to the problem. A series of steady-state and transient tests on the ASD have been conducted. Key results from the steady-state test include the ASD harmonics and the ASD response to voltage rise, drop, and unbalance For the transient tests, documented results included the effect of the transients of shunt capacitor switching on the ASD performance and the effect of line reactors for minimizing the transients due to capacitor switching. Tests are performed with the ASD connected to power supplies representing a stiff and a weak system. The results are compared to the guidelines provided in the revised IEEE Standard 519
Keywords :
harmonics; machine testing; transients; variable speed drives; ASD operation; IEEE Standard 519; adjustable speed drive; harmonics; shunt capacitor switching; steady-state tests; transient tests; tripping; voltage drop; voltage rise; voltage unbalance; Capacitors; Guidelines; Inductors; Performance evaluation; Power supplies; Shunt (electrical); Steady-state; System testing; Variable speed drives; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition, 1992. APEC '92. Conference Proceedings 1992., Seventh Annual
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-0485-3
Type :
conf
DOI :
10.1109/APEC.1992.228419
Filename :
228419
Link To Document :
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