• DocumentCode
    3266725
  • Title

    Structured architecture for test systems (SATS) hardware interface standards

  • Author

    Stora, Michael J.

  • Author_Institution
    VXI Assoc. Inc., Boonton, NJ, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    707
  • Lastpage
    718
  • Abstract
    The Structured Architecture Test System (SATS) is the culmination of several years of study to define a more structured approach to integrating VXI, PXI VME, IEC, RFI subset standards into a cohesive system solution. This is done primarily to preserve test program rehostability, equipment reconfigurability, and technology evolution requirements. It further reduces customization/augmentation, test program development, and interface costs, while increasing competition. Fundamental design is being developed through industry participation to assure product viability and long-term commitments to the standard. VXI Associates with government support will assist in completing the necessary coordination, funding, and standard´s process. The program is actively seeking instrument suppliers to develop modules meeting the standard
  • Keywords
    automatic test equipment; automatic test software; open systems; peripheral interfaces; standardisation; virtual instrumentation; IEC; PXI; RFI; SATS interface; Structured Architecture Test System; TPS cost reduction; VME; VXI; automatic test system; cohesive system solution; equipment reconfigurability; hardware interface standards; industry participation; interface costs; open architecture; product viability; subset standards; technology evolution requirements; test program development; test program rehostability; Defense industry; Fixtures; Government; Hardware; Instruments; Packaging; Software testing; Standards development; System testing; US Department of Defense;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
  • Conference_Location
    San Antonio, TX
  • ISSN
    1080-7725
  • Print_ISBN
    0-7803-5432-X
  • Type

    conf

  • DOI
    10.1109/AUTEST.1999.800445
  • Filename
    800445