• DocumentCode
    3266797
  • Title

    Software architecture requirements for DoD automatic test systems

  • Author

    Malesich, Michael

  • Author_Institution
    Naval Air Warfare Center Aircraft Div., Lakehurst, NJ, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    731
  • Lastpage
    739
  • Abstract
    The DoD has achieved success with recent Automatic Test Equipment (ATE) families, as evidenced by the Navy´s Consolidated Automated Support System (CASS) and the Army´s Integrated Family of Test Equipment (IFTE) programs. However, as these Systems age, the increased requirements for technology insertion due to instrument obsolescence and the demands of advanced electronics are becoming evident. Advances in test technology promise to yield reduced Total Ownership Costs (TOC) for ATE which can incorporate the new technology. The DoD Automatic Test System (ATS) Executive Agent Office (EAO) objective is to leverage technology to significantly reduce total ownership cost. Several objectives have been identified including use of synthetic instruments, support for legacy Test Product Sets (TPSs) and more efficient ways of developing TPSs. The NxTest software architecture will meet the objectives by providing an open systems approach to the system software. This will allow for the incorporation of commercial applications in the TPS development and execution environments and support current advances in test technology
  • Keywords
    automatic test equipment; automatic test software; military computing; military equipment; software architecture; ATE; Army; Consolidated Automated Support System; DoD; Integrated Family of Test Equipment; Navy; NxTest software architecture; Total Ownership Costs; commercial applications; instrument obsolescence; legacy Test Product Sets; synthetic instruments; technology insertion; Automatic test equipment; Automatic testing; Costs; Instruments; Open systems; Software architecture; Software testing; System software; System testing; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
  • Conference_Location
    San Antonio, TX
  • ISSN
    1080-7725
  • Print_ISBN
    0-7803-5432-X
  • Type

    conf

  • DOI
    10.1109/AUTEST.1999.800448
  • Filename
    800448