Title :
Measurement of chirp in semiconductor lasers using interferometric intensity noise
Author :
Sheridan, J. ; Shtengel, G.E. ; Kazarinov, R.F.
Author_Institution :
Lucent Technol., AT&T Bell Labs., Breinigsville, PA, USA
Abstract :
Frequency chirp in semiconductor lasers is a critical physical parameter for both analog and digital communications system performance. Here we describe a method for measuring chirp which uses the interferometric properties of standard fiber instead of a separate interferometer
Keywords :
chirp modulation; electro-optical modulation; laser noise; laser variables measurement; light interferometry; optical fibre communication; semiconductor device noise; semiconductor device testing; semiconductor lasers; analog communications system performance; critical physical parameter; digital communications system performance; interferometric intensity noise; interferometric properties; light interferometers; semiconductor laser chirp measurement technique; semiconductor laser frequency chirp; standard fiber; Chirp modulation; Fiber lasers; Frequency modulation; Laser noise; Noise measurement; Optical fibers; Optical interferometry; Optical noise; Semiconductor device noise; Semiconductor lasers;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1997. LEOS '97 10th Annual Meeting. Conference Proceedings., IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-3895-2
DOI :
10.1109/LEOS.1997.645371
