DocumentCode :
326690
Title :
3-D simulation of subsurface PEC sensing for discrimination enhancement using bistatic positional, angular, and polarization diversity
Author :
Haider, S.A. ; O´Neill, K. ; Paulsen, K.D.
Author_Institution :
Thayer Sch. of Eng., Dartmouth Coll., Hanover, NH, USA
Volume :
1
fYear :
1998
fDate :
6-10 July 1998
Firstpage :
520
Abstract :
This paper presents results intended to improve our understanding of the gains to be made in subsurface electromagnetic discrimination by employing bistatic positional, angular, and polarization diversity. Applying a 3-D finite element approach eliminates any restriction to axisymmetric geometries in targets and environment; and recent numerical innovations allow us to perform meaningful 3-D simulations at the workstation level. For specificity we assume an incident wave polarized in the (X,Z) plane of incidence, where Z is aligned with longitudinal target axis, for orientable targets. The simulations show physically explicable gains in discrimination from bistatic, polarimetric, multi-angle observation, even at a single frequency, with wavelengths an order of magnitude larger than characteristic target dimensions.
Keywords :
Maxwell equations; electromagnetic induction; electromagnetic wave scattering; finite element analysis; inverse problems; magnetic sensors; object detection; object recognition; weapons; 3-D finite element approach; 3-D simulations; Maxwell´s curl equations; angular diversity; bistatic positional diversity; discrimination enhancement; multi-angle observation; orientable targets; perfectly matched layer; polarization diversity; shape discrimination; subsurface electromagnetic discrimination; subsurface sensing; unexploded objects; Electromagnetic scattering; Electromagnetic wave polarization; Finite element methods; Frequency; Geometry; Lighting; Particle scattering; Rayleigh scattering; Shape; Soil;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium Proceedings, 1998. IGARSS '98. 1998 IEEE International
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-7803-4403-0
Type :
conf
DOI :
10.1109/IGARSS.1998.702958
Filename :
702958
Link To Document :
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