DocumentCode :
3266957
Title :
Applying innovative test technologies to emerging EO weapons systems
Author :
James, Richard A.
Author_Institution :
Product Support Div., Raytheon Syst. Co., Fullerton, CA, USA
fYear :
1999
fDate :
1999
Firstpage :
809
Lastpage :
813
Abstract :
Previous Autotestcon papers have dealt with the technical challenges of testing EO weapon systems with accurate, yet portable EO test equipment, such as Raytheon´s Chameleon EO analyzer. This paper describes the most demanding challenge yet; testing the ATFLIR system. Currently under development by Raytheon systems company in El Segundo, CA, ATFLIR is the latest and most sophisticated tactical EO weapon system. The ATFLIR system combines a high resolution 3rd GEN Targeting FLIR, a TV Camera, a high-powered tactical laser Designator/Rangefinder, a training eye-safe laser rangefinder, a laser spot tracker, and a 3rd GEN Navigational FLIR all on a inertially stabilized gimbaled platform. This paper specifically discusswa the use of the Chameleon EO analyzer in support of ATFLIR system-level testing. Included are some of the many technical challenges of testing such an advanced system, with it´s high performance imaging and it´s multi-spectral, multi-functional coaxial optical path
Keywords :
automatic test equipment; electronic equipment testing; laser ranging; military systems; optical radar; optical tracking; production testing; weapons; ATFLIR system; ATFLIR system-level testing; Chameleon EO analyzer; GEN Navigational FLIR; Raytheon systems company; emerging EO weapons; eye-safe laser rangefinder; high performance imaging; high-powered tactical laser Designator/Rangefinder; inertially stabilized gimbaled platform; laser spot tracker; multispectral multi-functional coaxial optical path; portable EO test equipment; tactical EO weapon system; Cameras; Laser stability; Navigation; Optical design; Optical imaging; System testing; TV; Target tracking; Test equipment; Weapons;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
Conference_Location :
San Antonio, TX
ISSN :
1080-7725
Print_ISBN :
0-7803-5432-X
Type :
conf
DOI :
10.1109/AUTEST.1999.800456
Filename :
800456
Link To Document :
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