• DocumentCode
    3267083
  • Title

    Static Detection of Logic Vulnerabilities in Java Web Applications

  • Author

    Kong, Ying ; Zhang, Yuqing ; Fang, Zhejun ; Liu, Qixu

  • Author_Institution
    Nat. Comput. Network Intrusion Protection Center, GUCAS, Beijing, China
  • fYear
    2012
  • fDate
    25-27 June 2012
  • Firstpage
    1083
  • Lastpage
    1088
  • Abstract
    Logic vulnerabilities occur when mistakes arise in the control flow associated to critical functionalities. We propose a lightweight static analysis approach to detect logic vulnerabilities in Java Web applications. The core idea of our approach is to discover deviant behaviors among duplication samples. Program slicing technique is leveraged to extract duplicated invocations targeted similar functionalities. Subsequently, path exploration is conducted to split slices into several path sensitive slices. Then we make comparison between any two similar slices on their path condition, and report the slices with abnormal path condition as logic vulnerabilities. We implemented our approach in a prototype tool named LVD (Logic Vulnerability Detector), and evaluated it on seven real world applications scaled from thousands to million lines of code. The evaluation results show that our approach achieves bigger coverage with acceptable cost and better scalability than previous approaches.
  • Keywords
    Internet; Java; data flow analysis; program slicing; security of data; Java Web applications; LVD; abnormal path condition; control flow; duplicated invocation extraction; duplication samples; logic vulnerability detector; path exploration; path sensitive slices; program slicing technique; static analysis; static detection; Access control; Approximation methods; Computer bugs; Electronic mail; Java; Navigation; Prototypes; Logic Vulnerabilities; Path Sensitive; Program Slicing; Static Detection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Trust, Security and Privacy in Computing and Communications (TrustCom), 2012 IEEE 11th International Conference on
  • Conference_Location
    Liverpool
  • Print_ISBN
    978-1-4673-2172-3
  • Type

    conf

  • DOI
    10.1109/TrustCom.2012.266
  • Filename
    6296095