Experimental results and modeling techniques for switching noise in mixed-signal integrated circuits

Author

Loinaz, M.J. ; Su, D.K. ; Wooley, B.A.

Author_Institution

Stanford Univ., CA, USA

fYear

1992

fDate

4-6 June 1992

Firstpage

40

Lastpage

41

Abstract

In mixed-signal integrated circuits, fast transients in digital circuits can perturb other circuits on the same die through both direct capacitive coupling between circuit nodes and interaction via the common substrate. The effects of substrate excitation by fast switching digital circuits are reported. Experimental results and modeling techniques presented apply to CMOS technologies with heavily doped substrates and the experimental method can also be used to study switching noise when the substrate is lightly doped.<>

Keywords

CMOS integrated circuits; circuit analysis computing; electromagnetic compatibility; mixed analogue-digital integrated circuits; transients; CMOS; capacitive coupling; experimental method; fast switching digital circuits; fast transients; heavily doped substrates; lightly doped substrates; mixed-signal integrated circuits; modeling techniques; substrate excitation; substrate noise; switching noise; Coupling circuits; Digital circuits; Integrated circuit modeling; Integrated circuit noise; Inverters; Mixed analog digital integrated circuits; Pins; Semiconductor device noise; Substrates; Switching circuits;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Circuits, 1992. Digest of Technical Papers., 1992 Symposium on

Conference_Location

Seattle, WA, USA

Print_ISBN

0-7803-0701-1

Type

conf

DOI

10.1109/VLSIC.1992.229246

Filename

229246