• DocumentCode
    3267489
  • Title

    Concept map-oriented technical writing approach for computer science majors in an EFL context: Understanding text applications

  • Author

    Roy, Debopriyo

  • Author_Institution
    Univ. of Aizu, Aizu, Japan
  • fYear
    2010
  • fDate
    7-9 July 2010
  • Firstpage
    67
  • Lastpage
    79
  • Abstract
    In this article, I argue for the importance of using specific kinds of concept maps, such as ladders, in a technical writing class offered for computer science majors. This article presents a strong argument that use of concept maps should be effectively integrated both during planning stages and as part of traditional document production techniques. Assignments and activities in a technical writing classroom should address the use of concept maps for conceptualizing, schematizing and presenting procedural information like software documentation, explaining laboratory reports etc. Using concept maps efficiently can lead to structural and functional conceptualization, visualization, representation and retention of complex information. A survey-based study reported in this article suggests that advanced students in an EFL technical thesis writing course in this computer science institute has enough expertise to understand the use and application of specialized concept maps for technical document production activities. Results indicate that students, on most part, understand specialized document-specific, task-specific applications and especially specific sentences in the domain of computer science and self-reports also indicate that they are reasonably confident about their ability to apply ladders in logical ways.
  • Keywords
    Application software; Computer graphics; Computer science; Documentation; Knowledge engineering; Laboratories; Natural languages; Production; Visualization; Writing; CMAP-Tools; Concept maps; Knowledge models; procedures; technical writing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Professional Communication Conference (IPCC), 2010 IEEE International
  • Conference_Location
    Enschede, Netherlands
  • Print_ISBN
    978-1-4244-8145-3
  • Type

    conf

  • DOI
    10.1109/IPCC.2010.5529816
  • Filename
    5529816