Title :
A new on-chip voltage regulator for high density CMOS DRAMs
Author :
Mao, R.S. ; Chao, H.H. ; Chi, Y.C. ; Chung, P.W. ; Hsieh, C.H. ; Lin, C.M. ; Lu, N.C.C. ; Lan, S.Y. ; Liu, Y.F. ; Lin, M.Z. ; Wang, D.W. ; Tuan, H.C. ; Tsai, H.H. ; Lu, C.Y.
Author_Institution :
Etron Technology Inc., Hsinchu, Taiwan
Abstract :
The authors report on new voltage regulator circuitry used in a 4 Mb CMOS DRAM. The DRAM accepts a 5 V external power supply and generates 3.3 V on chip. The chip photomicrograph is provided with a magnified portion of the regulator. The internal voltage V/sub INT/ is regulated at 3.3 V (25 degrees C), while V/sub DD/ varies from 3.3 to 6.2 V. V/sub INT/ presents a positive temperature coefficient, which is adjustable, to compensate the higher cell leakage and the slowdown of MOSFET operations at higher temperature. While V/sub DD/ is raised above 6.3 V, the regulator enters the burn-in mode where V/sub INT/ follows a 2/3 V/sub DD/ curve, which gives an exact internal burn-in voltage as desired. This internal burn-in voltage is insensitive to temperature and process variations.<>
Keywords :
CMOS integrated circuits; DRAM chips; voltage regulators; 3.3 V; 4 Mbit; CMOS DRAM; MOSFET operations; burn-in mode; internal burn-in voltage; internal voltage; on-chip voltage regulator; positive temperature coefficient; Chaos; Delay; Energy consumption; MOSFET circuits; Power supplies; Random access memory; Regulators; Temperature; Voltage; Voltage-controlled oscillators;
Conference_Titel :
VLSI Circuits, 1992. Digest of Technical Papers., 1992 Symposium on
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-7803-0701-1
DOI :
10.1109/VLSIC.1992.229268
