DocumentCode
3267923
Title
Computational intelligence based machine fault diagnosis
Author
Wang, D.D. ; YANG, Debing ; Xu, Jinwu ; Xu, Ke
Author_Institution
Fac. of Mech. Eng., Beijing Univ. of Sci. & Technol., China
fYear
1996
fDate
2-6 Dec 1996
Firstpage
465
Lastpage
469
Abstract
Machine fault diagnosis is a well established area where specific techniques are used to determine fault patterns or locations. In recent years, there are many studies about this issue by means of model based approach, probabilistic method, knowledge based approach and neural networks based approach et al. With the progress of the study of biology, evolutionary thought has extended into engineering problem-solving. More interests have been shown in this field. The investigation will describe two unsupervised clustering paradigms, Kohonen´s self-organizing scheme and genetic algorithm (GA) based heuristic searching, for machine fault classification. In case study, a multiple faults classification problem has been attacked. Solutions generated from the GA based system are compared with that from self-organization neural networks, and the result is given, and the case study has shown that the proposed approaches are flexible enough to be used in practical fault diagnosis
Keywords
engineering computing; fault diagnosis; genetic algorithms; heuristic programming; knowledge based systems; machine testing; pattern classification; self-organising feature maps; computational intelligence based machine fault diagnosis; engineering problem-solving; fault locations; fault patterns; genetic algorithm; heuristic searching; knowledge based approach; machine fault classification; multiple faults classification problem; self-organization neural networks; unsupervised clustering paradigms; Biological system modeling; Computational intelligence; Equations; Fault diagnosis; Genetic algorithms; Kernel; Mechanical engineering; Neural networks; Neurons; Unsupervised learning;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Technology, 1996. (ICIT '96), Proceedings of The IEEE International Conference on
Conference_Location
Shanghai
Print_ISBN
0-7803-3104-4
Type
conf
DOI
10.1109/ICIT.1996.601632
Filename
601632
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