• DocumentCode
    32683
  • Title

    Real-Time Voltage and Resistance Features in Microprobe Testing Process

  • Author

    Qing Yuan ; Lei Han ; Junhui Li ; Dasong Ge

  • Author_Institution
    State Key Lab. of High Performance Complex Manuf., Central South Univ., Changsha, China
  • Volume
    5
  • Issue
    2
  • fYear
    2015
  • fDate
    Feb. 2015
  • Firstpage
    274
  • Lastpage
    278
  • Abstract
    A testing circuit of probe is designed to understand the real-time characteristics of the probe during testing process. The constant resistance voltage and probe voltage are measured simultaneously by DSOX2022A oscilloscope, and the real-time resistance of probe is calculated. The result shows that the probe resistance varies from the initial infinity to approximately $1~Omega $ at 0.2 ms when the probe is in contact with the copper substrate. The resistance of the probe is gradually reduced to relatively stable value with the increasing of compressed displacement. The probe resistance increases badly in initial 30 times testing when the angle between probe and copper changes from 0° to 2°, and reduces to a stable value after 20-30 times testing.
  • Keywords
    circuit testing; constant resistance voltage; microprobe testing process; probe resistance; probe voltage; real-time characteristics; testing circuit; time 0.2 ms; Copper; Educational institutions; Probes; Resistance; Substrates; Testing; Voltage measurement; Angle; contact resistance; oscilloscope; probe; probe.;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2015.2389834
  • Filename
    7018042