DocumentCode
3268357
Title
An approach to test security of EPCglobal class 1 generation 2 RFID system
Author
Hongsheng, Zhao ; Jie, Tan ; Zhiyuan, Zhu
Author_Institution
Inst. of Autom., Chinese Acad. of Sci., Beijing, China
fYear
2010
fDate
17-19 June 2010
Firstpage
77
Lastpage
80
Abstract
In this paper we present an approach to test the security of RFID system. Starting from a division of RFID system architecture, we divide the security of RFID system into three parts: fore-end subsystem security, back-end subsystem security, security caused by malicious software. To each part, several test cases are listed to test security. The key benefit is that this approach can solve the interoperation problem of security when RFID system in application is not provided by the same provider.
Keywords
Automation; Communication system security; Databases; IEC standards; ISO standards; Information analysis; Information security; Power system security; Radiofrequency identification; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
RFID-Technology and Applications (RFID-TA), 2010 IEEE International Conference on
Conference_Location
Guangzhou, China
Print_ISBN
978-1-4244-6698-6
Type
conf
DOI
10.1109/RFID-TA.2010.5529864
Filename
5529864
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