DocumentCode :
3268357
Title :
An approach to test security of EPCglobal class 1 generation 2 RFID system
Author :
Hongsheng, Zhao ; Jie, Tan ; Zhiyuan, Zhu
Author_Institution :
Inst. of Autom., Chinese Acad. of Sci., Beijing, China
fYear :
2010
fDate :
17-19 June 2010
Firstpage :
77
Lastpage :
80
Abstract :
In this paper we present an approach to test the security of RFID system. Starting from a division of RFID system architecture, we divide the security of RFID system into three parts: fore-end subsystem security, back-end subsystem security, security caused by malicious software. To each part, several test cases are listed to test security. The key benefit is that this approach can solve the interoperation problem of security when RFID system in application is not provided by the same provider.
Keywords :
Automation; Communication system security; Databases; IEC standards; ISO standards; Information analysis; Information security; Power system security; Radiofrequency identification; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
RFID-Technology and Applications (RFID-TA), 2010 IEEE International Conference on
Conference_Location :
Guangzhou, China
Print_ISBN :
978-1-4244-6698-6
Type :
conf
DOI :
10.1109/RFID-TA.2010.5529864
Filename :
5529864
Link To Document :
بازگشت