DocumentCode :
3268410
Title :
Model And Solution Of Reverse Short Channel Effect
Author :
Tsui, Bing-Yue ; Wang, Chih-Chiang ; Yang, Tzung-Zu ; Hwang-Leu, Shyang ; Lin, Geeng-Lih ; Wong, Shyh-Chyi
fYear :
1997
fDate :
3-5 June 1997
Firstpage :
237
Lastpage :
240
Keywords :
Degradation; Electronics industry; Industrial electronics; Isolation technology; Jacobian matrices; MOSFET circuits; Predictive models; Reliability engineering; Silicon; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, Systems, and Applications, 1997. Proceedings of Technical Papers. 1997 International Symposium on
Conference_Location :
Taipei, Taiwan
ISSN :
1524-766X
Print_ISBN :
0-7803-4131-7
Type :
conf
DOI :
10.1109/VTSA.1997.614766
Filename :
614766
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3268410
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