• DocumentCode
    3268637
  • Title

    A functional verification method for pipelined DSP

  • Author

    Yu Qiao-yan ; Liu, Peng ; Yao, Qing-dong ; Chen, Ke-ming

  • Author_Institution
    Dept. of Inf. Sci. & Electron. Eng., Zhejiang Univ., Hangzhou, China
  • Volume
    3
  • fYear
    2004
  • fDate
    18-21 Oct. 2004
  • Firstpage
    2055
  • Abstract
    As the complexity and quality expectation of pipelined DSPs increases, while the time-to-market decreases, functional verification has become a more difficult process and has emerged as the bottleneck of the development cycle. In order to improve the efficiency and the effectiveness of functional verification, a novel verification for pipelined DSP is presented, which includes an automatic high-coverage self-checking model and a pipeline-based model. The former model is based on a heuristic algorithm to verify the total instructions execution of the pipelined DSP, especially the arithmetic function units, and successfully achieves a high statement hit rate close to 100% and high reliability, but requires a little manual intervention. In contrast, the later model validates the complex pipeline mechanism of the DSP completely and gets 89% statement hit rate and 93% branch hit rate, which is 2.16∼6.85 times more than that of application programs. With those two models, sufficient test programs are generated and convenient ways to confirm the execution results from the pipelined DSP are provided as well.
  • Keywords
    automatic test pattern generation; digital arithmetic; digital signal processing chips; formal verification; integrated circuit testing; logic testing; pipeline processing; arithmetic function units; automatic high-coverage self-checking model; branch hit rate; functional verification method; heuristic algorithm; pipeline-based model; pipelined DSP; statement hit rate; test program generation; total instructions execution verification; Automatic control; Digital signal processing; Formal verification; Heuristic algorithms; Manuals; Microprocessors; Pipelines; Power generation; Testing; Time to market;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
  • Print_ISBN
    0-7803-8511-X
  • Type

    conf

  • DOI
    10.1109/ICSICT.2004.1435247
  • Filename
    1435247