Benchmarking of test-generation systems

Author

Goel, P. ; Chen, Harry

Author_Institution

Gateway Design Autom. Corp., Westford, MA, USA

fYear

1988

fDate

Feb. 29 1988-March 3 1988

Firstpage

334

Lastpage

337

Abstract

Several aspects to consider in the benchmarking of automatic test-generation systems are discussed. In particular, the important issues in creating benchmark circuits for automatic test-pattern generation are explored, emphasizing speed/capacity testing. An attempt is made to explain the ways in which depth of circuitry, local vs. global feedback, synchronous vs. asynchronous logic, number of primitives, and structural characteristics of subcircuits relate to the costs of automatic test-generation.<>

Keywords

logic testing; asynchronous logic; automatic test-generation systems; automatic test-pattern generation; benchmark circuits; benchmarking; circuitry depth; global feedback; local feedback; primitives; speed/capacity testing; structural characteristics; subcircuits; synchronous logic; Automatic testing; Benchmark testing; Character generation; Circuit testing; Combinational circuits; Feedback circuits; Logic testing; Manufacturing processes; Stress; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Compcon Spring '88. Thirty-Third IEEE Computer Society International Conference, Digest of Papers

Conference_Location

San Francisco, CA, USA

Print_ISBN

0-8186-0828-5

Type

conf

DOI

10.1109/CMPCON.1988.4885

Filename

4885

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3268735