Title :
Benchmarking of test-generation systems
Author :
Goel, P. ; Chen, Harry
Author_Institution :
Gateway Design Autom. Corp., Westford, MA, USA
fDate :
Feb. 29 1988-March 3 1988
Abstract :
Several aspects to consider in the benchmarking of automatic test-generation systems are discussed. In particular, the important issues in creating benchmark circuits for automatic test-pattern generation are explored, emphasizing speed/capacity testing. An attempt is made to explain the ways in which depth of circuitry, local vs. global feedback, synchronous vs. asynchronous logic, number of primitives, and structural characteristics of subcircuits relate to the costs of automatic test-generation.<>
Keywords :
logic testing; asynchronous logic; automatic test-generation systems; automatic test-pattern generation; benchmark circuits; benchmarking; circuitry depth; global feedback; local feedback; primitives; speed/capacity testing; structural characteristics; subcircuits; synchronous logic; Automatic testing; Benchmark testing; Character generation; Circuit testing; Combinational circuits; Feedback circuits; Logic testing; Manufacturing processes; Stress; System testing;
Conference_Titel :
Compcon Spring '88. Thirty-Third IEEE Computer Society International Conference, Digest of Papers
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-8186-0828-5
DOI :
10.1109/CMPCON.1988.4885
