Title :
A 3.3 V 128 Mb multi-level NAND flash memory for mass storage applications
Author :
Tae-Sung Jung ; Young-Joon Choi ; Kang-Deog Suh ; Byung-Hoon Suh ; Jin-Ki Kim ; Young-Ho Lim ; Yong-Nam Koh ; Jong-Wook Park ; Ki-Jong Lee ; Jung-Hoon Park ; Kee-Tae Park ; Jang-Rae Kim ; Jeong-Hyong Lee ; Hyung-Kyu Lim
Author_Institution :
Samsung Electron. Co. Ltd., Kiheung, South Korea
Abstract :
The NAND flash memory was originally designed to target solid-state mass storage applications. Key requirements of mass storage, low cost and high serial access throughput, have been achieved by sacrificing a non-critical feature, fast random access. For a quantum step in cost reduction, the multi-level cell is combined with NAND flash memory. This 128 Mb multi-level NAND flash memory stores two bits per cell by tight programmed cell threshold voltage (Vth) control and is made practical by significantly reducing program disturbs.
Keywords :
CMOS memory circuits; EPROM; NAND circuits; 128 Mbit; 3.3 V; NAND flash memory; cost; multi-level cell; program disturbs; programmed threshold voltage control; serial access throughput; solid-state mass storage; Circuit noise; Circuit simulation; Costs; Flash memory; Latches; Pins; Solid state circuit design; Threshold voltage; Throughput; Voltage control;
Conference_Titel :
Solid-State Circuits Conference, 1996. Digest of Technical Papers. 42nd ISSCC., 1996 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-3136-2
DOI :
10.1109/ISSCC.1996.488501