Title :
Noise Suppression In Low Voltage Differential I/O
Author :
Haulin, Tord ; Hedberg, Mats
Keywords :
Circuit noise; Degradation; Electronic equipment; Frequency; Impedance; Low voltage; Noise robustness; Power transmission lines; Telecommunications; Transmitters;
Conference_Titel :
VLSI Technology, Systems, and Applications, 1997. Proceedings of Technical Papers. 1997 International Symposium on
Conference_Location :
Taipei, Taiwan
Print_ISBN :
0-7803-4131-7
DOI :
10.1109/VTSA.1997.614771