• DocumentCode
    3269522
  • Title

    Electrical properties of Ba0.8Sr0.2TiO3 thin film with NTC effect [thin film resistor]

  • Author

    Liu, Y.R. ; Lai, P.T. ; Li, G.Q. ; Li, B. ; Huang, M.Q. ; Lou, J.

  • Author_Institution
    Dept. of Appl. Phys., South China Univ. of Technol., Guangzhou, China
  • Volume
    3
  • fYear
    2004
  • fDate
    18-21 Oct. 2004
  • Firstpage
    2226
  • Abstract
    Ba0.8Sr0.2TiO3 thin films, deposited on a SiO2/Si substrate by an argon ion-beam sputtering technique, are used to fabricate thin-film resistors by standard integrated-circuit technology. The resistance-temperature characteristics of the thin-film resistor show that the thin-film resistor has good thermal sensitivity with negative temperature coefficient from room temperature to 200°C (-5.3%°C-1 at 30°C for a test voltage of 6 V) as opposed to the positive temperature coefficient of the same material in sintered ceramic form. The current-voltage characteristics reveal that in the low-voltage region,. thermionic emission is dominant, while in the high-voltage range, a space-charge limited conduction mechanism plays a major role. In the medium-voltage range, there is the normal ohmic behavior. The effects of frequency on the impedance of the thin-film resistor at various temperatures are also investigated.
  • Keywords
    barium compounds; electric resistance; space charge; sputtered coatings; strontium compounds; thermal properties; thermionic emission; thin film resistors; 20 to 200 degC; 30 degC; 6 V; Ar; BST thin film; BaSrTiO3-SiO2-Si; NTC effect; argon ion-beam sputtering; high-voltage region space-charge limited conduction; impedance frequency effects; low-voltage region thermionic emission; negative temperature coefficient; ohmic behavior; resistance-temperature characteristics; thermal sensitivity; thin-film resistors; Argon; Materials testing; Resistors; Semiconductor thin films; Sputtering; Strontium; Substrates; Temperature sensors; Thermal resistance; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
  • Print_ISBN
    0-7803-8511-X
  • Type

    conf

  • DOI
    10.1109/ICSICT.2004.1435287
  • Filename
    1435287