DocumentCode :
3269522
Title :
Electrical properties of Ba0.8Sr0.2TiO3 thin film with NTC effect [thin film resistor]
Author :
Liu, Y.R. ; Lai, P.T. ; Li, G.Q. ; Li, B. ; Huang, M.Q. ; Lou, J.
Author_Institution :
Dept. of Appl. Phys., South China Univ. of Technol., Guangzhou, China
Volume :
3
fYear :
2004
fDate :
18-21 Oct. 2004
Firstpage :
2226
Abstract :
Ba0.8Sr0.2TiO3 thin films, deposited on a SiO2/Si substrate by an argon ion-beam sputtering technique, are used to fabricate thin-film resistors by standard integrated-circuit technology. The resistance-temperature characteristics of the thin-film resistor show that the thin-film resistor has good thermal sensitivity with negative temperature coefficient from room temperature to 200°C (-5.3%°C-1 at 30°C for a test voltage of 6 V) as opposed to the positive temperature coefficient of the same material in sintered ceramic form. The current-voltage characteristics reveal that in the low-voltage region,. thermionic emission is dominant, while in the high-voltage range, a space-charge limited conduction mechanism plays a major role. In the medium-voltage range, there is the normal ohmic behavior. The effects of frequency on the impedance of the thin-film resistor at various temperatures are also investigated.
Keywords :
barium compounds; electric resistance; space charge; sputtered coatings; strontium compounds; thermal properties; thermionic emission; thin film resistors; 20 to 200 degC; 30 degC; 6 V; Ar; BST thin film; BaSrTiO3-SiO2-Si; NTC effect; argon ion-beam sputtering; high-voltage region space-charge limited conduction; impedance frequency effects; low-voltage region thermionic emission; negative temperature coefficient; ohmic behavior; resistance-temperature characteristics; thermal sensitivity; thin-film resistors; Argon; Materials testing; Resistors; Semiconductor thin films; Sputtering; Strontium; Substrates; Temperature sensors; Thermal resistance; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
Print_ISBN :
0-7803-8511-X
Type :
conf
DOI :
10.1109/ICSICT.2004.1435287
Filename :
1435287
Link To Document :
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