Title :
Effect of noise suppression by surge protective devices for impulsive noise
Author :
Kanbayashi, Tetsuro ; Tsuda, Fumishiro ; Shinohara, Shinichi ; Sato, Risaburo
Author_Institution :
Electromagn. Compatibility Res. Labs. Co. Ltd., Sendai, Japan
Abstract :
The response characteristics of surge protective devices for impulsive noise characterized by fast rise times are examined. These response characteristics are calculated in the time domain using an equivalent circuit model for a voltage clamping device. Calculated values were found to agree well with measured values and the appropriateness of the equivalent circuit model was demonstrated. Based on this model, the amount of inductance in low-capacitance devices was found to be a major factor in generating overshoot above the clamp voltage in the noise rising interval
Keywords :
electromagnetic interference; equivalent circuits; impulse noise; interference suppression; surge protection; time-domain analysis; clamp voltage; equivalent circuit model; fast rise times; impulsive noise; inductance; low-capacitance devices; noise rising interval; noise suppression; overshoot generation; response characteristics; surge protective devices; time domain; voltage clamping device; Circuit noise; Clamps; Electromagnetic compatibility and interference; Equivalent circuits; Frequency measurement; Semiconductor device noise; Surge Protective Devices - c62; Surges; Time measurement; Voltage;
Conference_Titel :
Electromagnetic Compatibility, 1999 International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
4-9980748-4-9
DOI :
10.1109/ELMAGC.1999.801258
