Title :
Measurements of potential distributions near flat boards
Author_Institution :
Ind. Res. Inst., Aichi, Japan
Abstract :
The authors have developed two types of 2-dimensional measurement systems that measure the potential distribution near electrified flat boards. One system is based on one accurate potential sensor with a mechanical scanning structure; the other system is based on an array of low cost FET probes. These systems show charge distribution on the board. The characteristics of these systems are certified using simply formed printed circuit boards (PCB). Examples of the entirely or partially charged PCB are also shown
Keywords :
printed circuit testing; printed circuits; probes; voltage measurement; 2-D measurement systems; charge distribution; electrified flat boards; low cost FET probes array; mechanical scanning structure; potential distributions measurements; potential sensor; printed circuit boards; Apertures; Charge measurement; Current measurement; Electric variables measurement; Electrostatic measurements; Force sensors; Instruments; Printed circuits; Sensor arrays; Voltage;
Conference_Titel :
Electromagnetic Compatibility, 1999 International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
4-9980748-4-9
DOI :
10.1109/ELMAGC.1999.801263
