Title :
Immunity testing of computerized equipment to fast electrical transients using adaptive test methods
Author :
Wendsche, Steffen ; Vick, Ralf ; Habiger, Ernst
Author_Institution :
Dept. of Autom. Control, Tech. Univ. Dresden, Germany
Abstract :
One of the major problems associated with testing computerized equipment for immunity, stems from the fact that their susceptibility to electrical transients is time-variant. This paper develops an improved statistical model for the susceptibility of computerized equipment to electrical transients and illustrates a few affordable methods for estimating the mean and maximum malfunction probability in an operational cycle. Reinforcement learning algorithms are used to estimate the maximum susceptibility efficiently. These algorithms automatically restrict testing to the most susceptible time windows. This allows affordable testing for safety-related equipment and also supports effective redesign
Keywords :
electromagnetic compatibility; electromagnetic interference; learning (artificial intelligence); microcontrollers; probability; testing; transient analysis; adaptive test methods; computerized equipment; fast electrical transients; immunity testing; maximum malfunction probability estimation; mean malfunction probability estimation; microcontrollers; reinforcement learning algorithms; safety-related equipment; statistical model; time-variant; Amplitude estimation; Automatic testing; Electrostatic discharge; Frequency; Hardware; IEC standards; Immunity testing; Microcontrollers; Probability; State estimation;
Conference_Titel :
Electromagnetic Compatibility, 1999 International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
4-9980748-4-9
DOI :
10.1109/ELMAGC.1999.801268