• DocumentCode
    3270219
  • Title

    Immunity testing of computerized equipment to fast electrical transients using adaptive test methods

  • Author

    Wendsche, Steffen ; Vick, Ralf ; Habiger, Ernst

  • Author_Institution
    Dept. of Autom. Control, Tech. Univ. Dresden, Germany
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    82
  • Lastpage
    85
  • Abstract
    One of the major problems associated with testing computerized equipment for immunity, stems from the fact that their susceptibility to electrical transients is time-variant. This paper develops an improved statistical model for the susceptibility of computerized equipment to electrical transients and illustrates a few affordable methods for estimating the mean and maximum malfunction probability in an operational cycle. Reinforcement learning algorithms are used to estimate the maximum susceptibility efficiently. These algorithms automatically restrict testing to the most susceptible time windows. This allows affordable testing for safety-related equipment and also supports effective redesign
  • Keywords
    electromagnetic compatibility; electromagnetic interference; learning (artificial intelligence); microcontrollers; probability; testing; transient analysis; adaptive test methods; computerized equipment; fast electrical transients; immunity testing; maximum malfunction probability estimation; mean malfunction probability estimation; microcontrollers; reinforcement learning algorithms; safety-related equipment; statistical model; time-variant; Amplitude estimation; Automatic testing; Electrostatic discharge; Frequency; Hardware; IEC standards; Immunity testing; Microcontrollers; Probability; State estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1999 International Symposium on
  • Conference_Location
    Tokyo
  • Print_ISBN
    4-9980748-4-9
  • Type

    conf

  • DOI
    10.1109/ELMAGC.1999.801268
  • Filename
    801268