Title :
Edge subpixel location of ellipse in computer vision measurement
Author :
Baozhang, Li ; Yanping Cui
Author_Institution :
Sch. of Mech. & Electron. Eng., Hebei Univ. of Sci. & Technol., Shijiazhuang, China
Abstract :
Ellipse is the important element in the computer vision measurement. A spatial moment operator with three gray model is researched. First the LOG operator is used to locate the edge at the level of pixel quickly, and then the spatial moment is used to detect subpixel location of the discrete points of edge. The least square fitting is adopted to fit the ellipse´s subpixel edge points which have been detected by Hough transform. The validity and precision of spatial moment subpixel edge detection and the detection of ellipse on image plane is studied. The experiments show that spatial moment subpixel edge detection and the detection of ellips on image plane have acquired high precision stability.
Keywords :
Hough transforms; edge detection; feature extraction; least squares approximations; Hough transform; LOG operator; computer vision measurement; edge subpixel location; ellipse detection; ellipse location; image plane; least square fitting; spatial moment operator; spatial moment subpixel edge detection; Image edge detection; Image resolution; Transforms; Edge detection; Ellipse extract; Hough transform; Least square fitting; Spatial moment;
Conference_Titel :
Advanced Computer Control (ICACC), 2011 3rd International Conference on
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-8809-4
Electronic_ISBN :
978-1-4244-8810-0
DOI :
10.1109/ICACC.2011.6016452
