DocumentCode :
3270532
Title :
Wafer level vertical interconnection method for microcolumn array
Author :
Han, Changho ; Kim, Hyeon Cheol ; Kang, Moon Koo ; Chun, Kukjin
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., South Korea
fYear :
2005
fDate :
25-28 Oct. 2005
Firstpage :
106
Lastpage :
107
Abstract :
A concept of miniaturized and arrayed electron beam system using vertical interconnection was proposed and fabrication with interconnection using metal reflow was performed. The interconnection of electron beam array is very important because all single columns should be controlled individually to obtain a uniformity of electron beam array. In addition, the interconnection area should be reduced to make the size of a single column smaller. Therefore, a vertical interconnection method was proposed and the schematic of vertically interconnected monolithic microcolumn is shown. The other advantages of this vertical interconnection method are controllable columns and removal of interference between columns (Han, 2005).
Keywords :
electron beam applications; integrated circuit interconnections; reflow soldering; wafer bonding; controllable columns; electron beam system; interconnection area; interference removal; metal reflow; microcolumn array; monolithic microcolumn; wafer level vertical interconnection method; Electrodes; Electron beams; Fabrication; Glass; Moon; Silicon; Stress; Temperature; Testing; Wafer bonding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2005 International
Print_ISBN :
4-9902472-2-1
Type :
conf
DOI :
10.1109/IMNC.2005.203760
Filename :
1595236
Link To Document :
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