DocumentCode :
3270585
Title :
Dependence of acid yield on resist thickness in chemically amplified electron beam resist
Author :
Shigaki, T. ; Okamoto, K. ; Kozawa, T. ; Yamamoto, H. ; Tagawa, S.
Author_Institution :
Inst. of Sci. & Ind. Res., Osaka Univ., Japan
fYear :
2005
fDate :
25-28 Oct. 2005
Firstpage :
112
Lastpage :
113
Abstract :
In this work, we quantified acid density generated in chemically amplified EB resists. The dependence of acid yield on resist thickness was made clear. The average density of acids nonlinearly increased with resist thickness. Although the accumulated energy is a good indicator, we have to consider how energy is consumed to generate acids for the accurate prediction of acid yields.
Keywords :
electron resists; acid density; acid yield; chemically amplified resist; electron beam resist; resist thickness; Absorption; Chemicals; Electron beams; Lithography; Optical films; Pattern formation; Polymers; Protons; Resists; Thickness measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2005 International
Print_ISBN :
4-9902472-2-1
Type :
conf
DOI :
10.1109/IMNC.2005.203763
Filename :
1595239
Link To Document :
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