Functional testing of content-addressable memories

Author

Lin, Kun-Jin ; Wu, Cheng-Wen

Author_Institution

Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan

fYear

1998

fDate

24-25 Aug 1998

Firstpage

70

Lastpage

75

Abstract

Functional tests for content-addressable memories (CAMs) are presented in this paper. The fault models considered are based on physical defects. In order to make our approach suited to various application specific CAMs, we propose tests which require only three fundamental types of operation, and the test results can be observed entirely from the single-bit match/hit output. A complete, compact test is also proposed, which has reasonable test length for modern high-density and large-capacity CAMs

Keywords

content-addressable storage; fault diagnosis; integrated circuit testing; logic testing; application specific CAMs; compact test; content-addressable memories; fault models; functional testing; high-density CAMs; large-capacity CAMs; physical defects; single-bit match/hit output; Application software; CADCAM; Cams; Circuit faults; Circuit testing; Computer aided manufacturing; Computer networks; Impedance matching; Logic; Read-write memory;

fLanguage

English

Publisher

ieee

Conference_Titel

Memory Technology, Design and Testing, 1998. Proceedings. International Workshop on

Conference_Location

San Jose, CA

Print_ISBN

0-8186-8494-1

Type

conf

DOI

10.1109/MTDT.1998.705950

Filename

705950