Title :
Functional testing of content-addressable memories
Author :
Lin, Kun-Jin ; Wu, Cheng-Wen
Author_Institution :
Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
Functional tests for content-addressable memories (CAMs) are presented in this paper. The fault models considered are based on physical defects. In order to make our approach suited to various application specific CAMs, we propose tests which require only three fundamental types of operation, and the test results can be observed entirely from the single-bit match/hit output. A complete, compact test is also proposed, which has reasonable test length for modern high-density and large-capacity CAMs
Keywords :
content-addressable storage; fault diagnosis; integrated circuit testing; logic testing; application specific CAMs; compact test; content-addressable memories; fault models; functional testing; high-density CAMs; large-capacity CAMs; physical defects; single-bit match/hit output; Application software; CADCAM; Cams; Circuit faults; Circuit testing; Computer aided manufacturing; Computer networks; Impedance matching; Logic; Read-write memory;
Conference_Titel :
Memory Technology, Design and Testing, 1998. Proceedings. International Workshop on
Conference_Location :
San Jose, CA
Print_ISBN :
0-8186-8494-1
DOI :
10.1109/MTDT.1998.705950
