Title :
Nano-ablation of inorganic materials using laser plasma soft X-rays at around 10 nm
Author :
Makimura, Tetsuya ; Miyamoto, Hisao ; Uchida, Satoshi ; Niino, Hiroyuki ; Murakami, Kouichi
Author_Institution :
Inst. of Appl. Phys., Tsukuba Univ., Japan
Abstract :
We have investigated direct nanomachining of inorganic materials using laser plasma soft X-rays. Soft X-rays (X) were generated by irradiation of Ta targets (Ta) with 532 nm Nd:YAG laser light(Y) with a pulse duration of 7 ns, at an energy density of about 104 J/cm2. Under the condition, Ta plasma emit soft X-rays at around 10 nm. The soft X-rays were focused on samples (Q) with a spot size of 150 μm, using an ellipsoidal mirror (M) that we designed so as to focus soft X-rays at around 10 nm efficiently. It was confirmed that SiO2 has optical absorption at around 10 nm. We found that synthetic quartz glass, fused silica, Pyrex, HF, CaF2, Al2O3 and LiNbO3 can be machined smoothly by irradiation with laser plasma soft X-rays. Typically, quartz glass is ablated at 40 nm/shot, and has a surface roughness less than 10 nm after 10 shots. In order to investigate lateral resolution, we fabricated a WSi contact mask with 200-nm-pitch line-and-space patterns on quartz glass. We found that quarts glass plates can be machined at a resolution less than 100 nm. In conclusion, we have established a technique for nanomachining a wide variety of inorganic materials using laser plasma soft X-rays at a precision less than 100 nm.
Keywords :
X-ray lithography; X-ray masks; aluminium compounds; calcium compounds; lanthanum compounds; laser ablation; lithium compounds; nanotechnology; silicon compounds; surface roughness; tungsten compounds; 10 nm; 150 micron; 532 nm; 7 ns; Al2O3; CaF2; LiNbO3; SiO2; WSi; contact mask; ellipsoidal mirror; energy density; inorganic materials; irradiation; laser plasma soft x-rays; lateral resolution; nano-ablation; nanomachining; optical absorption; pulse duration; surface roughness; Glass; Inorganic materials; Mirrors; Nanostructured materials; Optical pulse generation; Plasma density; Plasma materials processing; Plasma x-ray sources; Surface emitting lasers; X-ray lasers;
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2005 International
Print_ISBN :
4-9902472-2-1
DOI :
10.1109/IMNC.2005.203778