DocumentCode :
3270957
Title :
From (integrated) circuits to systems of systems on chip in five decades: How did and will (IC) test technology keep up?
Author :
Ivanov, André
Author_Institution :
Univ. of British Columbia, Vancouver
fYear :
2007
fDate :
5-8 Aug. 2007
Firstpage :
1542
Lastpage :
1543
Abstract :
The past five decades amount to mind boggling progress in IC design and manufacturing technology. In this period, we have gone from the inception of ICs to now what literally amounts to the integration of systems of systems on chip. Whereas experts debate the continued evolution of ICs according to Moore´s law beyond the next decade, the advent of the complex integration of multi-physics systems is just in its infancy and is predicted to grow exponentially in the coming years. Designing and manufacturing complex ICs is of course a feat in itself. Testing and testability has often been taken for granted as a necessary (not to say evil) requirement. But who wants of an IC that cannot be duly tested, to ensure quality and reliability, especially when deployed in life-critical applications? Test technology, along with design technology has had to make enormous and rapid progress over the past half-century. Here, we highlight some of the key elements of IC test technology. We briefly mention some directions and challenges and opportunities for test technology in the near future, especially as multi-physics integrated systems of systems continue to emerge and progress on the volume production curves.
Keywords :
integrated circuit design; system-on-chip; Moore law; integrated circuits; manufacturing complex IC design; manufacturing technology; multiphysics integrated systems; multiphysics systems; systems on chip; Application specific integrated circuits; Circuit testing; Integrated circuit technology; Integrated circuit testing; Life testing; Manufacturing; Moore´s Law; Production systems; System testing; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2007. MWSCAS 2007. 50th Midwest Symposium on
Conference_Location :
Montreal, Que.
ISSN :
1548-3746
Print_ISBN :
978-1-4244-1175-7
Electronic_ISBN :
1548-3746
Type :
conf
DOI :
10.1109/MWSCAS.2007.4488835
Filename :
4488835
Link To Document :
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