Title :
On Design of Temperature Invariant Physically Unclonable Functions Based on Ring Oscillators
Author :
Kumar, Raghavan ; Patil, Vinay C. ; Kundu, Sandip
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Massachusetts Amherst, Amherst, MA, USA
Abstract :
CMOS implementation of Physically Unclonable Functions (PUFs) facilitates a number of applications ranging from digital rights management, device authentication, counterfeit detection/prevention and cryptographic key generation. Key expectations from such PUF circuits are high (i) uniqueness and (ii) reliability. Uniqueness refers to differentiated responses over challenge-response pairs. Reliability demands unvarying responses under varying environmental conditions such as temperature, supply voltage and noise. This paper describes two methods for achieving the above goals in a ring oscillator based PUF. The first method exploits the negative temperature resistance property of n+ and p+ polysilicon placed as source feedback resistors to de-sensitize ring oscillators to temperature variations. The second method uses an optimized supply voltage (V´DD) to reduce the temperature sensitivity of delay based ring oscillator PUFs. We report an improvement in reliability of 16% by combining these methods. Further, we propose a temperature-invariant ring oscillator PUF architecture based on Serial-Input Serial-Output (SISO) topology. In the proposed design, the relative phase difference between two ring oscillators is translated to a digital response bit. We show that this phase difference based response generation is superior to frequency based response generation in terms of area and power.
Keywords :
circuit reliability; oscillators; resistors; CMOS; challenge-response pair; counterfeit detection; counterfeit prevention; cryptographic key generation; device authentication; differentiated response; digital response bit; digital rights management; negative temperature resistance property; phase difference based response generation; polysilicon; serial-input serial-output topology; source feedback resistor; temperature invariant physically unclonable function design; temperature sensitivity reduction; temperature-invariant ring oscillator PUF architecture; Delay; Integrated circuit reliability; Resistance; Ring oscillators; Temperature sensors; Hardware Security; PUF; RFID; Serial-In Serial-Out (SISO); Temperature Coefficient of Resistance; Zero temperature Coefficient Voltage;
Conference_Titel :
VLSI (ISVLSI), 2012 IEEE Computer Society Annual Symposium on
Conference_Location :
Amherst, MA
Print_ISBN :
978-1-4673-2234-8
DOI :
10.1109/ISVLSI.2012.66